Content by NIST
Tracking Nanoparticles in 3-D
Wed, 04/09/2008 - 22:00
Heart of the orthogonal tracking microscope system developed at NIST is this nanoparticle solution sample well etched in silicon. Careful orientation of the silicon crystal makes it possible to chemically etch angled sides in… NIST Report on U.S. Innovation Tags Measurement ChallengesThe USMS assessment will focus first on semiconductors, autos, and software
Wed, 03/14/2007 - 22:00
(National Institute of Standards and Technology, Washington, D.C.) -- A new report from the National Institute of Standards and Technology (NIST), An Assessment of the United States Measurement System: Addressing Measurement Barriers to Accelerate…
Mon, 08/17/2026 - 12:02
From our bank accounts to smartphones, all our sensitive data and devices are protected with a technology known as cryptography. Present-day cryptography essentially uses a very challenging set of math problems that are nearly impossible for current…