NIST’s Indenter Tunes In to Measure Surface PropertiesTouchless surface detector precisely determines hardness, elasticity, and creep
Mon, 07/29/2013 - 17:02
Researchers from the National Institute of Standards and Technology (NIST) and the University of North Carolina have demonstrated a new design for an instrument, a “instrumented nanoscale indenter,” that makes sensitive measurements of the… Book Discount Available for NACMA Conference Attendees20-percent discount on <em>Coordinate Measuring Machines and Systems</em>
Mon, 07/22/2013 - 10:06
(NIST: Gaithersburg, MD) -- National Institute of Standards and Technology (NIST) authors and CRC Press have arranged to give all attendees at the 2013 North American Coordinate Metrology Association (NACMA) conference a 20-percent discount on the… NIST Workshop Gets a ‘Grip’ on Robotics ChallengeSeeking robotic hands as dexterous as the human variety
Thu, 07/11/2013 - 11:22
Even though modern industrial robots are becoming more nimble and capable, they still need to get a good grip on things, literally, with the equivalent of hands that are as agile and dexterous as the human variety.
How to tackle this thorny… Quantum Dot Technique Combines Optical and Electron MicroscopyEvades two problems in nanoscale microscopy
Wed, 06/26/2013 - 08:54
Researchers working at the National Institute of Standards and Technology (NIST) have developed a new microscopy technique that uses a process similar to how an old tube television produces a picture—called cathodoluminescence—to image nanoscale… Microscopy Technique Could Help Develop 3D Computer ComponentsAs designers pack more onto chips, the only direction left to build is upward
Wed, 06/26/2013 - 08:49
A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to monitoring the next generation of computer-chip circuit components, potentially providing… The Better to See You WithScientists build record-setting metamaterial flat lens
Wed, 05/29/2013 - 12:07
For the first time, scientists working at the National Institute of Standards and Technology (NIST) have demonstrated a new type of lens that bends and focuses ultraviolet (UV) light in such an unusual way that it can create ghostly, 3D…
Don’t Miss the NACMA @ NIST Workshop and ConferenceAug. 27–30, 2013, in Gaithersburg, MD
Wed, 05/29/2013 - 09:11
(NIST: Gaithersburg, MD) -- The National Institute of Standards and Technology (NIST) is hosting and co-organizing the 2013 North American Coordinate Metrology Association (NACMA) meeting, Aug. 27–30, 2013, at NIST in Gaithersburg, Maryland…
Get a Whiff of This Innovative Spectroscopy TechniqueDifferent frequencies pass through gas in a few milliseconds
Wed, 05/15/2013 - 12:02
Detecting greenhouse gases in the atmosphere could soon become far easier with the help of an innovative technique developed by a team at the National Institute of Standards and Technology (NIST), where scientists have overcome an issue preventing… NIST Measurement Tool on Target for Fast-Growing MEMS IndustryTest chips promote greater interoperability among different brands of consumer electronics
Wed, 05/01/2013 - 16:47
The market for miniature, hybrid machines known as MEMS, which are microelectromechanical systems, is diversified, and the National Institute of Standards and Technology (NIST) has introduced a long-awaited measurement tool that will help…
Reliably Wireless in Urban TopographyNIST demonstrates improvements to emergency radio communications in New York
Thu, 04/18/2013 - 11:13
Given recent events--the Boston Marathon bombings and the huge fertilizer plant explosion in West, Texas--the editors thought it would be interesting to highlight the recent efforts by NIST and others to improve the communications technology…