Accelerates CAM programming time 80% to make U.S. manufacturers more productive
Enables scanning electron microscopes to perform in situ Raman spectroscopy
Certified for use in Class 1, Zone 0, Zone 1, and Zone 2 locations
Smart-manufacturing data platform collects, presents, and initiates accurate process and metrology data
Supports back-end process control
Quantum nanometrology just got a step closer
Produces clearer images of samples of any shape in which dense areas mask less dense areas
For processed, frozen, and preprocessed vegetables, confections, and more
Three new single-column models with capacities of 0.5 kN, 1 kN, and 2.5 kN
At Pack Expo Las Vegas, Las Vegas Convention Center, Sept. 11–13, 2023
Featuring exceptional linearity, low noise, and stability
Onsemi XGS sensors up to 45 MP
New models can test wide range of motor sizes on a single system
Streamlines the ISO certification process
ORNL team members applied three independent strategies to decrease their project’s computational workload
Emphasizes the importance of data traceability in leak testing
ORNL-developed software tools to be demonstrated at Energy Bootcamp, Oct. 16–19, 2023, in Knoxville, TN
Puts focus on problems associated with manual setup, calibration, and robot maintenance
How to capture, communicate, and digitally render appearance characteristics for a more efficient workflow
Aug. 23–26, 2023, in Mumbai, India
