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Metris Responds to Hexagon Lawsuit
Claim that law suit is "baseless."
Product News: Hexagon Introduces New Leica Total Station
Most accurate Leica Geosystems total station ever released for industrial use
Product News: Lattice Technology Releases Updated XVL Converter Products
Conversion of 3-D CAD data into XVL v10, the industry’s most lightweight 3-D format.
Product News: Real-Time 3-D Measure/Compare on Moving Parts
HandyPROBE with Verisurf software accurately captures 3-D data on moving parts and compares to CAD in real time.
Product News: iVue and iScope Microscopes with Networking
Plug-and-go microscope systems integrate all components.
Product News: Agilent Chromatograph Functional Verification Service
Service provides factory-recommended equipment maintenance of Agilent chromatographs for those who need to maintain ISO/IEC 17025 certification.
Product News: Unique Part Holder for Noncontact Scanning
NVision and FixLogix partner to provide economical and modular part-holding system.
Product News: Instant Quotes for Scanning, Comparative Analysis Services
Two-day turnaround on first-article comparisons
Product News Update: PC-DMIS Vision 2009, Watch MultiCapture Demo
MultiCapture feature improves vision system productivity by 35% or more.
Product News: Metrologic V5 Inspection Solutions in CATIA R19SP3
Many new functionalities and capabilities
Product News: sigPOD PSV Released
User-configurable solution can be used to test or monitor any manufacturing operation.
Hexagon Metrology Initiates Litigation Against Metris and Mitutoyo
Patent infringement suit concerns portable articulated arms with infinite rotation.
Product News: Tohnichi Unveils BTGE Digital Torque Gauge
Ideal for precise testing of low torque ranges.
ASTM: Electrochemical Test Measurement Technique for Corrosion
G199 is primarily geared toward laboratory-based users.
CMSC: More Than a Trade Show for 3-D Measurement
Open, educational venue inspires collaborative atmosphere.
Product News: Novo-Gloss I.Q. Glossmeter
New hand-held device is sensitive to how light is reflected from a surface.
Product News: Olympus Defect Review Solution
New defect inspection and review system for semiconductors, flat panels, photovoltaic components, and more.
Statistical Technique Improves Precision of Nanotechnology Data
Improved measurement could facilitate industrial applications.
UL Creates Largest Solar Testing Lab in North America
Photovoltaic testing facility expansion was completed in San Jose, California.
Product News: Delcam launches Delcam.TV online TV channel

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