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Value Stream Mapping Math

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I <span style="color:#F00">&#9829</span> Technical Presentations

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Being that this is Valentine’s Day, I can think of no better time and place to express my undying love—for the technical presentations that are offered each year at the Coordinate Metrology Systems Conference.

Comparing Equivalent Point Cloud Data From Contact and Noncontact Measurement Techniques

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To demonstrate that a typical spacecraft reflector is designed and manufactured according to specifications and caters to postulated performances, a detailed testing and verification campaign must be conducted.

Mergers and Acquisitions in the World of Metrology

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Two major acquisitions were announced in early January 2013, and it is not surprising that both companies were software developers and long-time players in the industrial measurement sector.

The Secret for Sustaining 5S

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Selecting Next-Generation Laser-Scanning Technology

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The current focus on improving production efficiency and part quality while meeting stringent production schedules is unrelenting. Measurement and inspection is one vital area that can benefit from advances in laser-scanning technology.

Benefits of Silicon-Based Temperature Sensors

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The need for low-cost temperature logging devices in the cold-chain industry has led to the development of silicon-based instruments that do not need calibration.

Christmas Wish: Meaningful Measurements

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All I want for Christmas is a meaningful measurement. I’m tired of “technical specifications” that have no real-world application.

Attracting the Next Generation of Research Scientists

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Much has been said about American students falling behind in science; minority students in particular are under-represented and tend to choose other career options.

When to Use LVDTs vs. Optical Scanning

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Gauging fixtures are a staple in many metrology labs and assembly lines. They offer a fast, easy, and inexpensive way to determine if a measured part passes tolerances.

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