ISO Publishes New Standard for Effective Risk Management
(ISO: Geneva) -- A new international standard, ISO 31000:2009—“Risk management—Principles and guidelines,” will help organizations of all types and sizes to manage risk effectively.
(ISO: Geneva) -- A new international standard, ISO 31000:2009—“Risk management—Principles and guidelines,” will help organizations of all types and sizes to manage risk effectively.
(ANSI: New York) -- The American National Standards Institute (ANSI) has joined forces with three of the biggest names in standards to develop an unprecedented resource for medical device standards and related information.
“Lean” has come to mean an integrated, end-to-end process viewpoint that combines the concepts of waste elimination, just-in-time inventory management, built-in quality, and worker involvement supported by a cultural focus on problem solving.
(NCQA: Washington) -- U.S.
(Solar Metrology: Halbrook, NY) -- Solar Metrology expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH.
(Struers Inc.: Westlake, OH) -- Struers Inc. introduces its new state-of-the-art micro/macro hardness testing product line, the DuraScan. With its extensive features and benefits, the DuraScan is a natural complement to Struers existing hardness testers.
The field of surface metrology is one of the fastest growing areas of engineering and quality management.
You know how sometimes you think everyone knows a secret that they haven’t let you in on? Well, I had the opposite happen to me the other day. I assumed everyone knew the purpose for measurement system analysis (MSA), a.k.a.
(ACSI: Ann Arbor, MI) -- After a surge through the second quarter, aggregate customer satisfaction as measured by the American Customer Satisfaction Index (ACSI) stalls. The ACSI loses 0.1 percent for the third quarter, which brings the Index to a score of 76.0 on a 100-point scale.
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology announces the release of PC-DMIS 2009 Minor Release 1 (MR1), an incremental update to PC-DMIS 2009, which was newly released in July 2009.
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