Product News: Fifth Generation of VAST Contact Scanning Available
(Carl Zeiss: Oberkochen, Germany) -- Carl Zeiss now offers the fifth generation of contact scanning with the new VAST Performance Kit.
(Carl Zeiss: Oberkochen, Germany) -- Carl Zeiss now offers the fifth generation of contact scanning with the new VAST Performance Kit.
(SAE: Warrendale, PA) -- Traditional and nontraditional developers and publishers of engineering information can now look to SAE International as an active partner to make content available to the mobility engineering community.
Until I was 30 years old, I wasn’t much of a fisherman. I’d take a rod and reel along on a camping trip, but I never expected to catch much of anything. In my mind, fishing was a relaxing pastime you enjoyed with friends and beer.
One of my favorite value-stream walks is with the senior managers of several organizations who share and jointly manage a value-creating process that stretches all the way from raw materials to the end customer.
(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc.
(FARO: Lake Mary, FL) -- FARO Technologies Inc., global provider of portable 3-D measurement and imaging solutions, has released an accurate, break-resistant, spherically mounted retroreflector (SMR) as a part of its newly expanded line of laser tracker targets.
(Olympus NDT: Waltham, MA) -- Olympus NDT introduces the first semiautomated (semi-AUT) ultrasound phased-array solution developed for corrosion mapping applications.
(Productivity Press: New York) -- Although it is a given that most lean companies adopt methods to standardize cyclical activities, they often fail to apply the same rigor to noncyclical work, believing that it cannot be measured.
(Omnex Inc.: Ann Arbor, MI) – Omnex Inc. will present “Advanced Product Quality Planning (APQP) & Design Failure Modes and Effects Analysis (DFMEA),” a one-day seminar on Aug. 23 in Ann Arbor, Michigan.
(Veeco: Tucson) -- Veeco Instruments Inc., a global provider of precision instrumentation and metrology solutions, announces a new ContourGT Optical Surface Profiler configuration op
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