(Kistler: Winterthur, Switzerland) -- Kistler, a global supplier of precision sensors, systems, and instrumentation for the dynamic measurement of pressure, force, torque and acceleration, has introduced the Type 9260AA, a portable multicomponent force plate, designed to measu

(ASTM: West Conshohocken, PA) -- Manufacturers of solar radiometers, and testing laboratories for solar energy, materials and durability testing will be among the primary users of a new ASTM International standard that outlines procedures using indoor test methods to calibrate radiometers with

(Cognex: Natick, MA) -- Cognex Corp. has introduced a new feature for its In-Sight vision systems that allows manufacturers to easily and automatically test the vision system and verify that it is functioning correctly.

(SAE: Warendale, PA) -- Project management (PM) and advanced product quality planning (APQP) are two critical techniques used in product development in the mobility industry.

(J.D. Power: Westlake Village, CA) -- More than two-thirds of owner-reported, new-vehicle interior problems are design-related issues rather than defects or malfunctions, according to the J.D. Power and Associates 2011 U.S. Interior Quality and Satisfaction Study.

If you don’t think our society is experiencing a communication overload, you really are living under a rock. We can record all of the ups and downs of our personal sagas through blogs. We can call or text anyone at any time.

Technology developed by Oxford University’s classics department could help reveal the secrets of historical documents.

Improvement in any organization is difficult enough, but if you don’t know about these counterintuitive truths, you stand to make things worse.

I’ve had the privilege of using laser trackers on many applications. One of the most interesting and rewarding applications is their use on machine tool calibrations.

(Wiley: Hoboken, NJ) -- Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology, edited by