(ISO: Geneva) -- The International Organization for Standardization (ISO) and ASTM International have signed an agreement to increase their cooperation in developing international standards for additive manufacturing—which refers to the process of joining materials to manufactured objects, us

When a nasty strain of E. coli flooded hospitals in Germany this summer, it struck its victims with life-threatening complications far more often than most strains—and the search for an explanation began.

(NZTE: Christchurch, New Zealand) -- A new report by New Zealand Trade and Enterprise suggests that New Zealand can provide a valuable model for health policy makers and IT professionals seeking to reduce costs and increase the quality of health care in the United States and other nations.

Most good manufacturing practices (GMP) training that I encounter is not necessarily bad, just irrelevant. In fact, the same could be said for most training departments. They jealously guard their turf and deliver mediocre, perfunctory training.

(Siemens: New York) -- Increases in productivity attributed to digital and lean manufacturing are driving changes in manufacturing processes and requiring additional training for workers.

The ability to see through walls is no longer the stuff of science fiction, thanks to new radar technology developed at MIT’s Lincoln Laboratory.

Maybe the best book to come across my desk this year is Melissa Pregill’s Become One (Rojo Press, 2010).

(Teledyne DALSA: Waterloo, Ontario) -- Teledyne DALSA, a Teledyne Technologies company and global leader in machine vision technology, has launched its new BOA Pro smart camera.

(Lumetrics: Rochester, NY) -- Lumetrics, a leading manufacturer of measurement technology, began shipment of its latest innovation, the LumetriScan 360, a fully automated, noncontact thickness measurement system for the medical industry.

(TriNano: Eindhoven, the Netherlands) -- TriNano is a new nano/micro coordinate measuring machine (CMM) for measuring objects with submillimeter features in 3-D and with nanometer uncertainty.