New Computer Vision Method Helps Speed Electronic Materials Screening
MIT graduate students Eunice Aissi (left) and Alexander Siemenn have developed a technique that automatically analyzes visual features in printed samples (pictured) to quickly determine key properties of new and promising semiconducting materials. Photo: Bryce Vickmark
Boosting the performance of solar cells, transistors, LEDs, and batteries will require better electronic materials made from novel compositions that have yet to be discovered.