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Product News: @RISK--Modeling Best Practices

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(Palisade: Ithaca, NY) -- When building simulation models with @RISK, consider the following best practices suggested by Palisade's director of training and consulting, Michael Rees, Ph.D.:

CMSC: More Than a Trade Show for 3-D Measurement

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The Coordinate Metrology Systems Conference (CMSC) is next week, July 20–24. There is no event in the United States better situated to communicate the value and return on investment of large scale 3-D metrology than the CMSC. This year’s CMSC, its 25th, will be held in Louisville, Kentucky.

The Engine and Fuel of Quality Improvement

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“I suffer simultaneously from amnesia and déjà vu. I have the feeling that I keep forgetting the same thing over and over again.”
—Steven Wright (surreal comedian)

Product News: Novo-Gloss I.Q. Glossmeter

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(Paul N. Gardner Company Inc.: Pompano Beach, FL) -- The Novo-Gloss I.Q. is the first hand-held instrument to profile how light is reflected from a surface. Traditional glossmeters measure quantitatively and aren't sensitive to effects that reduce appearance quality. The Novo-Gloss I.Q.

Product News: Olympus Defect Review Solution

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(Olympus: Center Valley, Pa.) -- Process engineers, fab managers, professionals in yield enhancement, process development, and failure analysis will benefit from the newly introduced Olympus defect inspection and review system, the company’s fast and accurate semiconductor defect review solution

Books: "The Firefly Effect--Build Teams That Capture Creativity and Catapult Results"

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(John Wiley & Sons Inc.: Hoboken, NJ) -- The recession is in full swing and companies everywhere are feeling the pain. Yours is likely no exception.

Large-Scale 3-D Metrology Highlighted at Upcoming CMSC

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Investing in capital equipment always involves an analysis of the return on investment (ROI), but never as much as during a recession.

Photogrammetry and 3-D Assembly

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Three-dimensional (3-D) assembly refers to the use of high-accuracy, in-place, 3-D coordinate measurement devices for the digital assembly of parts. This process is often referred to as computer-aided manufacturing (CAM) or gaugeless manufacturing.

Statistical Technique Improves Precision of Nanotechnology Data

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(Georgia Institute of Technology: Atlanta) -- A new statistical analysis technique that identifies and removes systematic bias, noise, and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have futur

UL Creates Largest Solar Testing Lab in North America

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(UL: Northbrook, IL) -- Underwriters Laboratories (UL), a provider of safety testing and certification, recently announced the completion of its photovoltaic testing facility expansion in San Jose, California.

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