Deriving the Success Run Theorem
Credit: Mathieu Turle on Unsplash
The success run theorem is one of the most common statistical rationales for sample sizes used for attribute data.
Credit: Mathieu Turle on Unsplash
The success run theorem is one of the most common statistical rationales for sample sizes used for attribute data.
In the era of the industrial internet of things (IIoT), assets of both information technology (IT) and operational technology (OT) are becoming more sophisticated—and they both generate and use more data.
(TÜV Rheinland North America: Littleton, MA) -- TÜV Rheinland North America, an industry leader in quality management solutions, has launched an e-shop aimed at simplifying the ISO certification process.
(UpNano: Vienna) -- With the release of the latest software upgrade for its NanoOne platform of high resolution 3D printers, UpNano has pushed the limits of the fastest 2-photon polymerization-based (2PP) 3D printer on the market.
(Oak Ridge National Laboratory: Oak Ridge, TN) -- Using the full capabilities of the Quantinuum H1-1 quantum computer, researchers from the U.S.
I’ve observed that ISO management system audits have remained largely unchanged, even after the advent of ISO 19011:2018, the auditing standard that superseded ISO 19011:2011.
Ever since the Industrial Revolution, people have feared that technology would take away their jobs. While some jobs and tasks have indeed been replaced by machines, others have emerged.
(ForTest: Modena, Italy) -- Tracing test data is an essential part of manufacturing. It allows you to control the entire production process and ensure product integrity from the initial manufacturing stages to distribution.
(ORNL: Oak Ridge, TN) -- Oak Ridge National Laboratory researchers have developed a training camp to help manufacturing industries reduce energy-related carbon dioxide emissions and improve cost savings.
With 74% of U.S. companies transitioning to a permanent hybrid work model, leaders are turning their attention to measuring the success of that model.
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