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Bangladesh’s New Metrology Lab Strengthens Country’s Industrial Base

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(UNIDO: Vienna) -- Kandeh K. Yumkella, director-general of the United Nations Industrial Development Organization (UNIDO), says that Bangladesh has the potential to become the metrology hub of South Asia.

SAE International, John Deere Announce “Learn Twice” Initiative

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(SAE International: Warrendale, PA) -- Through a corporate gift of $250,000 from John Deere, SAE International announces its new “John Deere/SAE International AWIM Learn Twice Initiative.”

Event: BSI Hosts Next ISO/IEC 20000 Webinar

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(BSI: Reston, VA) -- BSI announces its next webinar in its free ISO/IEC 20000 Series, “Requirements for Service Level Management and Service Level Reporting,” which happens on Thursday, June 17, at 1 p.m. EDT.

Book: Internal Quality Auditing

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(Paton Professional: Chico, CA) -- If your organization is registered to ISO 9001 or any other management system standard, you’ve got an internal audit process.

Product News: Quality Management Software from Claromentis

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(Claromentis Ltd.: Brighton, UK) -- The release of a comprehensive, customizable quality management suite by Claromentis addresses information and audit management in an integrated web-based suite that can fit seamlessly into existing information frameworks.

Effectiveness of ISO 9001 Certification To Be Assessed in Study

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(IAF: Sydney, Australia) -- It would not be an exaggeration to say that the ISO 9001 standard from the International Organization for Standardization (ISO) brought about a revolution in the field of quality assurance.

“Dark Pulse” Laser Produces Bursts of… Almost Nothing

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(NIST: Gaithersburg, MD) -- In an advance that sounds almost Zen, researchers at the National Institute of Standards and Technology (NIST) and JILA, a joint institute of NIST and the University of Colorado at Boulder, have demonstrated a new type of pulsed laser that excels at not produ

Product News: OIM 6.0 Electron Backscatter Diffraction Software

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(EDAX Inc.: Mahwah, NJ) -- EDAX Inc., part of AMETEK Inc.’s Material Analysis Division, a provider of X-ray microanalysis and electron diffraction instrumentation, continues to lead the industry with its recent release of OIM 6.0.

Vision Show Attendance Doubled from 2009

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(AIA: Ann Arbor, Michigan) -- The Vision Show, held in Boston, May 25–27, had double the attendees of 2009’s show and conference. The positive response to the show and conference parallel the recovery of the market and growth in the industries that are seeking vision and imaging solutions.

Webinar: Noncontact, 3-D Optical Surface Profilometry

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(Veeco Instruments Inc.: Plainview, NY) -- As part of its ongoing series of live webinars on 3-D, noncontact surface profilometry, Veeco Instruments Inc.

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