(IHI: Cambridge, MA) -- The Institute for Healthcare Improvement (IHI) is offering a virtual professional development program for middle managers, “Leading Quality Improvement: Essentials for Managers.” This in-depth event provides 11 one-hour sessions beginning Jan. 11 through Aug.
(Intertek: Hong Kong and Oak Brook, IL) -- Intertek, a global provider of quality and safety solutions serving a wide range of industries around the world, announces the launch of US CPSIA for iPad, a mobile digital device application for the U.S.
(TUV Rheinland of North America: Newtown, CT) -- TÜV Rheinland, a European notified body for numerous European Union (EU) directives, announced a new service guarantee for 10-day turnaround of CE marking certificates for the Medical Device Directive (MDD) of the European Union (EU).
(Rockwell Automation: Milwaukee) -- Two new families of sensors from Rockwell Automation address the most demanding applications in the food and beverage industry.
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Micro-Epsilon: Raleigh, NC) -- Whatever doesn’t fit will be made to fit. This statement could have been the thought when the optoNCDT 1700Z-10 sensor was developed.
(Zwick Roell AG: Ulm, Germany) -- To further increase the effectiveness and energy efficiency of power stations and turbine technology, systems are operated at ever-greater pressures an
(StandardAero: Orlando, FL) -- As military aircraft grow more complex, components have become increasingly interdependent, making it difficult to isolate causes for system faults.
To get on Inc. Magazine’s 2010 list of the fastest-growing privately held companies means opening up your books to auditors and documenting your growth from 2006 through 2009. Of course, not every growing company has the inclination or time to play along.
(ASQ: Milwaukee) -- Organizations know the key to survival is maintaining a high level of customer satisfaction, because keeping customers is much easier than earning new ones. Those organizations also know that using lean and Six Sigma helps them to stay fiscally competitive.
(Paul N.