(Olympus NDT: Waltham, MA) -- Olympus is pleased to announce the introduction of new 10-meter long scopes for the lightweight IPLEX LX and IPLEX LT industrial videoscopes.

(CMS: Benbrook, TX) -- The Coordinate Metrology Society (CMS) is sponsoring its 26th annual conference, the Coordinate Metrology Systems Conference (CMSC), in Reno, Nevada, July 12–16.

(Wichita State University: Washington) --  Airlines and airline passengers are discovering that less can be better. Fewer flights and fewer fliers have translated into better performance.

(AMT: McLean, VA) -- The U.S.

(Camstar: Charlotte, NC) -- Medical device companies are operating in a challenging environment of continuously innovating and launching new products while reducing product and process variability and risk and simultaneously complying with stringent Food and Drug Administration (FDA) regulations

(DMSC Inc.: Arlington, TX) -- A training workshop on the Dimensional Measuring Interface Standard (DMIS) is scheduled for the week of April 19–22. This workshop will use the new DMIS 5.2 as well as the I++ Dimensional Measurement Equipment (DME) Specification.

(Emerson Process Management: Austin, TX) -- Emerson Process Management, a global business of Emerson, applauds the International Electrotechnical Commission’s (IEC) unanimous vote to certify WirelessHART technology as the first global standard for wireless communications for industrial process m

(ANSI: Washington) -- Only three weeks remain to submit an entry to the 2010 U.S. Celebration of World Accreditation Day paper competition launched by the American National Standards Institute (ANSI). Paper submissions are due by April 30.

(PTI Inspection Systems: Tuckahoe, NY) -- Seal-Sensor is the newest addition to PTI’s Seal-Scan line of noncontact ultrasound inspection systems.

(IQMS: Paso Robles, CA) -- IQMS, an innovator in the design and development of extended enterprise resource planning (ERP) software, recently announced the release of its Quality Audit Module, the most recent addition to the IQMS