(Rockwell Automation: Milwaukee, WI) -- Rockwell Automation has extended its PlantPAx Process Automation System with the new PlantPAx Logix Batch and Sequ

(ASTM: W. Conshohocken, PA) -- The eighth edition of the ASTM International Manual on Presentation of Data and Control Chart Analysis is now available.

(Renishaw: Gloucestershire, UK) -- Renishaw advances technology in laser interferometer calibration with the “lean design” XL-80 system.

(Veeco Instruments Inc.: Plainview, NY) -- Veeco Instruments Inc. has announced that it has agreed to sell its metrology business to Bruker Corp., a provider of high-performance scientific instruments and solutions for molecular and materials research, for $229 million in cash.

(NIST: Gaithersburg, MD) -- NIST will use the new ultra-dark detector, described in a new paper in Nano Letters, to make precision laser power measurements for advanced technologies such as optical communications, laser-base

In an open letter, Douglas K. Woods, president of The Association For Manufacturing Technology (AMT) urges Congress and the administration to help rebuild the U.S. manufacturing sector.
--Editor

(Extensible CAD Technologies: Raleigh, NC) -- Extensible CAD Technologies announces a new release of InspectionXpert for Solid Edge.

(Advanced Test Equipment Rentals: San Diego) -- Advanced Test Equipment Rentals, a provider of electronic test and measurement equipment rentals, has agreed with Emerson Process Mana

(Palisade: Ithaca, NY) -- Risk and decision analysis software specialist, Palisade Corp., has announced its decision to sponsor the Society of Decision Professionals www.decisionprofessionals.com.

(Xradia: Concord, CA) -- A new lab-based computed tomography (CT) system, capable of delivering synchrotron-like 3-D imaging at 50 nanometer (nm) resolution within a laboratory setting, was announced today by Xradia Inc.