Teledyne FLIR Adds Six New Cameras
(Teledyne FLIR: Goleta, CA) -- Teledyne FLIR has introduced new Blackfly S cameras with 8 MP–20 MP Sony Pregius S sensors to its Blackfly S GigE line. The additions include:
Exact Metrology Trains the Next Generation of Workers
(Exact Metrology: Cincinnati) -- Exact Metrology, a division of In-Place Machining Co. and a comprehensive 3D metrology service provider and hardware sales company, provides extensive training to both customers and operators ranging from basic to advanced operations.
Peak Metrology Partners With IDC MicroInspection
(Peak Metrology: Pittsburgh) -- Peak Metrology, a surface metrology capital equipment manufacturer, has announced a partnership with IDC MicroInspection, combining the equipment and hardware capabilities of Peak with the process knowledge and application software of IDC.
Live, In-Person Surface Roughness, Texture, and Tribology Class/Workshop
(Michigan Metrology: Livonia, MI) -- Registration is now open for the Roughness, Texture, and Tribology class and workshop, which will be held in Livonia, Michigan, May 3–5, 2023.
Videoscope Makes Wind Turbine Gearbox Inspections Faster, More Efficient
(Evident: Waltham, MA) -- Wind turbine gearbox inspections take place in cramped quarters, so inspection tools must be both compact and effective.
How Do You Know You’re Getting What You Pay For at the Grocery Store?
(NIST: Gaithersburg, MD) -- Inspectors in every U.S. state inspect and test scales at grocery stores and food manufacturing plants by using standard weights and rigorous procedures to help ensure the measurements are done correctly and fairly.
Starrett Introduces Enhanced, Highly Accurate Electronic Indicators
(L.S. Starrett: Athol, MA) – The L.S.
Advanced Photonix Offers Surface-Mount Silicon and Indium Gallium Arsenide Photodetectors
(Advanced Photonix: Camarillo, CA) -- Advanced Photonix, a division of OSI Optoelectronics, designs and manufactures Silicon (Si) and Indium Gallium Arsenide (InGaAs) surface-mount technology (SMT) photodetectors for high-speed response applications.
NIST Technique Simultaneously Locates Multiple Defects on Microchip Circuits
(NIST: Gaithersburg, MD) -- Defective computer chips are the bane of the semiconductor industry. Even a seemingly minor flaw in a chip packed with billions of electrical connections might cause a critical operation in a computer or other sensitive electronic device to fail.
VXintegrity Software Platform: Surface Damage Assessment Modernized
(Creaform: Lévis, QC, Canada) -- Creaform, a business unit of AMETEK and worldwide leader in portable 3D measurement solutions and engineering services, has released VXintegrity, the ultimate 3