(Bytewise Measurement Systems: Columbus, GA) -- Bytewise Measurement Systems explains why the affordable CrossCheck laser profile sensors are perfectly suited to monitor and control web-based and extruded materials.
(Advanced Test Equipment Rentals: San Diego) -- The Fluke 435 three-phase power quality analyzer helps locate, predict, prevent, and troubleshoot problems in three- and single-phase power dis
(Solar Metrology: Halbrook, NY) -- Solar Metrology expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH.
(Struers Inc.: Westlake, OH) -- Struers Inc. introduces its new state-of-the-art micro/macro hardness testing product line, the DuraScan. With its extensive features and benefits, the DuraScan is a natural complement to Struers existing hardness testers.
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology announces the release of PC-DMIS 2009 Minor Release 1 (MR1), an incremental update to PC-DMIS 2009, which was newly released in July 2009.
(Capture 3D: Costa Mesa, CA) -- Capture 3D, together with Trilion Quality Systems, is excited to announce the “Go Lean and Be Smart with 3D Metrology Techniques Workshop” U.S. tour.
(Mahr Federal: Providence, RI) -- Mahr Federal Inc.
(NVision: Coppell, TX) -- A custom gun grip manufacturer has substantially improved the quality of its products by using the MobileScan HD portable 3-D laser s
(NIST: Gaithersburg, MD) -- If you’re watching the complex processes in a living cell, it is easy to miss something important—especially if you are watching changes that take a long time to unfold and require high-spatial-resolution imaging.
(Dickson: Addison, IL) -- Quality managers and others responsible for maintaining the integrity of temperature and/or humidity chart recorders or data loggers, can now download a comprehensive guide to all aspects of instrument calibration at