(Spectronics Corp.: Westbury, NY) -- The Spectroline FC-150 ultrahigh intensity UV inspection lamp has a built-in fan that reduces operating temperatures and prevents the lamp from becoming

(Olympus Corp.: Tokyo) -- Olympus Corp. will commence international sales of the 38DL PLUS ultrasonic thickness gauge. This new nondestructive testing device allows objects to be inspected without the need for destruction or disassembly.The gauge will go on sale in Japan in fall 2010.

(AME: Rockford, IL) -- Advanced Machine & Engineering Co. (AME) announces the unveiling of www.ame.com, the company’s new corporate web site.

(SICK: Minneapolis) -- SICK, a global manufacturer of sensors, safety systems, machine vision, and automatic identification products for factory and logistics automation, announces the launch of the world’s first high-speed 3-D camera with high-quality color capability.

(Veeco Instruments Inc.: Tucson, AZ) -- Veeco Instruments Inc., a global provider of precision instrumentation and metrology solutions for scientific and industrial markets, announced a new low-cost member of its ContourGT family of noncontact, 3-D optical surface profilers.

(MicroRidge Systems: Sunriver, OR) -- MobileCollect represents the third generation of wireless measurement collection from MicroRidge Systems Inc.

(INUS Technology Inc.: Seoul) -- INUS Technology Inc. has announced that the Mephisto 3-D scanner from 3D Dynamics now includes a license of Rapidform XOS. This powerful combination of hardware and software allows users to capture, process, and edit 3-D scans for a variety of purposes, including

(NIST: Gaithersburg, MD) -- Demonstrating that chemistry sometimes can inform history, researchers from the National Institute of Standards and Technology (NIST), Colorado College, and Mount Saint Mary’s University in Emmitsburg, Maryland, have shown that sensitive nondestructive evaluation (NDE

(Nikon Metrology: Brighton, MI) -- At Eastec 2010, happening May 25–27, Nikon Metrology Inc.