(Carl Zeiss IMT: Maple Grove, MN) -- Carl Zeiss IMT and Koepfer America have formally joined with a new business partner agreement for the United States and Canada.

(Nikon Metrology: Brighton, MI) -- Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform.

(Nikon Metrology: Brighton, MI) -- Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform.

(Delcam: Birmingham, UK) -- Delcam has launched the 2010 R2 version of its PowerINSPECT inspection software.

(Mettler-Toledo Inc.: Columbus, OH) -- Mettler-Toledo introduces the new SWD440 dual-ended-beam weigh module. The SWD440 weigh modules offer good value for general-purpose weighing of tanks, hoppers, and original equipment manufacturer machinery.

Fluorescence microscopy requires an intense light source at the specific wavelength that will excite fluorescent dyes and proteins. The traditional method employs a white light, typically from a mercury or xenon arc lamp.

(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc. will distribute Lasertec’s Optelics H1200, a real color confocal microscope with unprecedented color separation and high resolution. The two companies have agreed that Nikon will distribute the system in the United States and Canada.

(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc. introduces the Confocal NEXIV-K6555 with advanced confocal metrology capabilities that provide new measurement possibilities for demanding applications.

(Carl Zeiss: Oberkochen, Germany) -- Carl Zeiss now offers the fifth generation of contact scanning with the new VAST Performance Kit.

(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc.