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Breakthrough Indentation Yield <br>Strength Test

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(Nanovea: Irvine, CA) -- Nanovea has introduced its patent-pending breakthrough method of reliably acquiring yield strength through indentation, which should replace the traditional tensile testing machine for yield strength measurement.

Flatness and Leveling Measuring System with Auto-Rotating Laser

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(LUDECA: Doral, FL) -- LEVALIGN EXPERT provides an accurate and easy-to-use method for the measurement of split machine casings, the flatness and straightness of machine bases and foundations, and the flatness and parallelism of circular, rectangular, and odd-shaped flanges.

Accurate Weighing of Bulk Materials Using XP Microbalance Sieve Analysis

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(Mettler-Toledo: Greifensee, Switzerland) -- Determining the size of particles is becoming increasingly important. If the particle distribution changes during the manufacturing process, then the quality of the finished product will also change.

Twin ARTEMIS Probes to Study Moon in 3-D

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(UC Berkeley: Berkeley, CA) -- On Sunday, July 17, the moon acquired two new companions in less than a month.

CMSC 2011 Rounds Out Conference With Exciting Special Events

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(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has announced its final schedule of events for the 27th annual Coordinate Metrology Systems Conference (CMSC) scheduled for July 25–29, 2011, at the Arizona Biltmore Hotel and Spa in Phoenix, Arizona.

Convince 2011 3-D Scanning and Quality Control System

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(3Shape: Copenhagen, Denmark) -- 3Shape, a global leader in 3-D scanners and CAD/CAM software solutions, has launched its latest Convince 2011 3-D Scanning and Quality Control system, a comprehensive solution for 3-D digitization and quality control of small, detail-rich objects.

Stream Microscope Software Gets Intuitively Easier

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(Olympus: Center Valley, PA) -- Olympus Stream Microscope Software v. 1.6 offers robust new features for users in industrial laboratory environments.

Newport Corp. Enters Into Agreement to Acquire Ophir Optronics

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(Newport Corp.: Irvine, CA) -- Newport Corp. has signed a definitive agreement to acquire Ophir Optronics Ltd., a global leader in precision infrared optics, photonics instrumentation, and 3-D noncontact measurement equipment.

Nemo Compact Gauge Computer Launched at Quality Expo

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(Marposs: Auburn Hills, MI) -- Marposs Corp. will introduce its Nemo ultra-compact gauge computer in booth No. 514 at Quality Expo, Sept. 20–22, 2011, at Chicago’s McCormick Place.

Perform Profile and Roughness Measurements on Nearly Any Material

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(Keyence: Woodcliff Lake, NJ) --The Keyence VK-X Series 3-D laser scanning microscopes combine the capabilities of SEMs and noncontact roughness gauges with the simplicity of an optical microscope.

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