Hexagon Metrology Launches PC-DMIS 2013 at HxGN LIVE
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has announced the launch of PC-DMIS 2013, a significant development release of the world’s most popular metrology software.
Hexagon Metrology Announces PC-DMIS Touch
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has introduced PC-DMIS Touch, a revolutionary measurement software for portable arm and DCC CMMs.
Don’t Miss the NACMA @ NIST Workshop and Conference
(NIST: Gaithersburg, MD) -- The National Institute of Standards and Technology (NIST) is hosting and co-organizing the 2013 North American Coordinate Metrology Association (NACMA) meeting, Aug. 27–30, 2013, at NIST in Gaithersburg, Maryland.
Hexagon Metrology Unveils eLearning Portal HexagonMetrologyU
(Hexagon: North Kingstown, RI) -- Hexagon Metrology today officially unveiled HexagonMetrologyU, the first e-learning portal designed to engage and support the metrology industry.
HandHeld Scanner Helps Production of Aluminum Die Castings
(NVision: Coppell, TX) -- Lighting Science uses the HandHeld laser scanner from NVision to ensure the dimensional integrity of the extremely complicated castings it purchases and uses in its roadway light emitting diode (LED) fixtures.
Along Comes the Spider
(Artec: Palo Alto, CA) -- Artec, developer of 3D scanning and 3D facial recognition technology has announced a new generation handheld, 3D scanner—Spider—named for its many “eyes.”
The Library of Congress Issues ISSN for the Journal of the CMSC
(Coordinate Metrology Society: San Diego) -- The Coordinate Metrology Society (CMS) recently announced the Library of Congress has issued ISSN numbers for the print and online versions of The Journal of the CMSC.
Hexagon Metrology Launches Online Technical Support Center
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has launched the Hexagon Metrology Support Center in conjunction with World Metrology Day, May 20, 2013. The online portal is a centralized resource for support of any Hexagon Metrology product.
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