JAI’s 2-CCD Camera
(JAI: San Jose, CA) -- JAI has released of the AD-132GE, a new two-charge coupled device (CCD) camera designed to produce high dynamic range (HDR) color images by intelligently combining different exposures from the camera’s dual sensors in real time.
Atomic Force Microscope for Biological Dynamics
(Bruker: Phoenix) -- At the Microscopy & Microanalysis (M&M) 2012 Annual Meeting, Bruker announced the Dimension FastScan Bio Atomic Force Microscope (AFM), which enables high-resolution microscopy res
Beamex MCS200 Calibration Workstation
(Beamex: Marietta, GA) -- Beamex introduces a new modular calibration system, MCS200. It is a modular test and calibration system for workshops and laboratories. The MCS200 offers efficient and ergonomic possibilities for the maintenance of process instruments.
WIZinspect 3D Laser Inspection Technology from Nextec
(Nextec: Eastlake, OH) -- Nextec Laser Metrology, a corporation serving the quality inspection market, has released WIZinspect, a 3D multiposition laser inspection solution that enables manufacturers to improve the quality control process with faster speed and higher precision while lowering cost
Weigh Modules Offer Simple Solutions for 100% In-Process Control
(Mettler-Toledo: Columbus, OH) -- New high-resolution weigh modules from Mettler-Toledo offer surprisingly fast and simple solutions for 100-percent in-process control.
Honeywell Introduces SMART Position Sensor, Rotary Configuration
(Honeywell: Morristown, NJ) -- Honeywell Sensing and Control, developer, manufacturer, and full service provider of switch and sensor solutions based in Golden Valley, Minnesota, is rounding out its SMART position sensor portfolio with the new Rotary Configuration that provides 360° noncontact an
Multiple Tool Setting and Inspection Probing for Machine Tools
(Renishaw: Hoffman Estates, IL) -- Renishaw, developer and manufacturer of precision technologies in measurement, motion control, spectroscopy, and precision machining, has a new RMI-Q multiple probe radio transmission system that uses a single radio receiver for tool setting probe and spindle-mo
Delcam to Show Probing Tools in FeatureCAM at IMTS
(Delcam: Birmingham, UK) -- Delcam will demonstrate new probing capabilities in the 2013 version of its FeatureCAM feature-based CAM software on booth E-3222 at IMTS Sept.
ace GigE Area Scan Cameras Now with CMOS Sensors by CMOSIS
(Basler: Ahrensburg, Germany) -- Digital industrial camera specialist Basler will soon be starting series production of its ace GigE camera models with powerful CMV2000 and CMV4000 complementary metal-oxide semiconductor (CMOS) sensors by CMOSIS, Antwerp, Belgium-based developer, manufacturer, an
