V-CAD Rapid Produces Measurements in Seconds
(Schneider Messtechnik, Bad Kreuznach, Germany) -- Schneider Messtechnik, a leading company in the field of production measurement technology, has launched V-CAD rapid, a 2D optical measuring device that is both mobile and compact.
Paul N. Gardner Releases Three Paint and Coating Testing Applicators
(Paul N. Gardner: Pompano Beach, FL) -- Paul N. Gardner Co. recently released three products for testing paints and coatings: an anti-sag meter, multiple clearance square applicator, and a stainless-steel bar film applicators.
DCS to Roll Out New Integration for High-End Visualization
(Dimensional Control Systems: Troy, MI) -- Dimensional Control Systems (DCS), developer of variation analysis and quality management system software and provider of engineering services, is presenting at RTT Excite 2013 June 20–21, 2013, at RTT’s (developer of unique solutions for product visuali
Hexagon Metrology Launches Optiv Classic 443 tp
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has announced the release of the Optiv Classic 443 tp coordinate measuring machine (CMM), the newest model in the Optiv Classic series.
Full House at 29th Annual CMSC
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has filled all 27 speaker slots at the 2013 Coordinate Metrology Systems Conference (CMSC) scheduled f
Hexagon Metrology Launches PC-DMIS 2013 at HxGN LIVE
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has announced the launch of PC-DMIS 2013, a significant development release of the world’s most popular metrology software.
Hexagon Metrology Announces PC-DMIS Touch
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has introduced PC-DMIS Touch, a revolutionary measurement software for portable arm and DCC CMMs.
Don’t Miss the NACMA @ NIST Workshop and Conference
(NIST: Gaithersburg, MD) -- The National Institute of Standards and Technology (NIST) is hosting and co-organizing the 2013 North American Coordinate Metrology Association (NACMA) meeting, Aug. 27–30, 2013, at NIST in Gaithersburg, Maryland.
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