(FARO: Lake Mary, FL) -- FARO Technologies Inc. (NASDAQ: FARO), the world's most trusted source for 3D measurement, imaging, and realization technology, announced it has released the new FARO Laser Scanner Focus3D X 330.

(Breuckmann: Meersburg, Germany) -- About 150 years ago, archaeologists in Cambodia made a spectacular discovery: the temple ruins of Angkor Wat.

(Nikon Metrology: Brighton, MI) -- CAMIO offers true multi-sensor capability, allowing best-practice selection of sensor technology for each task.

(Solutionix: Bristol, UK) -- Solutionix, the leading developer and manufacturer of structured-light 3D scanning solutions, announced that HJC, the world’s largest manufacturer of motorcycle crash helmets, relied on a Solutionix Rexcan 3D scanner to provide the 3D digital data required to design a

(API: Newport News, VA) -- API Services, a subsidiary of metrology provider Automated Precision Inc. (API), announced this month that it has reached partnerships with two design and manufacturing leaders in the nuclear and energy industries.

(Extech Instruments: Nashua, NH) -- Known worldwide for its superior test and measurement tools, Extech Instruments has announced that its versatile TKG series of ultrasonic thickness gauges is now available.

(Danatronics: Danvers, MA) -- Danatronics has announced the latest addition to its thickness gauge family: the EHC-03. Packaged in the same, field-proven, IP54-rated case as its  EHC-09 series, the EHC-03 is now Danatronics’ entry-level thickness gauge.

(Instron: Norwood, MA) -- Instron, a leading provider of testing equipment designed to evaluate mechanical properties of materials and components, has launched its Digital Image Correlation (DIC) Software.

(Quality Digest: Chico, CA) -- Are you passionate about quality? Do you want to lead tens of thousands of like-minded quality individuals? Then this job is for you.

(HEIDENHAIN: Schaumburg, IL) -- Industrial applications that create many parts require fast and efficient quality checking stations. This means that maintaining accurate and correct measuring processes during the highest level of throughput is critical.