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Product News: Mettler-Toledo Excellence XP Balances

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(Mettler Toledo Inc.: Columbus, OH) – Mettler Toledo, a leading global supplier of precision instruments and services, presents its Exc

Product News: High Temp, High Accuracy, On-Line Corrosion Monitoring

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(GE: Billerica, MA) –  Rightrax HT, the latest on-line corrosion monito

Product News: Navitar Launches Optical Wizard Version 2.0

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(Navitar Inc.: Rochester, NY) -- Navitar Inc., a supplier of high magnification imaging optics for machine vision and biomedical applications, has announced the launch of its second generation interactive online lens selector tool, the Optical Wizard 2.0, now available at

Product News: Free Low-Level DC Measurements Handbook

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(Keithley: Cleveland) -- With Keithley's Low Level Measurements Handbook, you get measurement advice that's critical to making accurate, low-level measurements. Request a copy today, and Keithley will send you a copy in the mail and grant you online access at no charge.

Metrology: NVision HandHeld Scanner Drastically Cuts Engine Modeling Time

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(NVision: Coppell, TX) -- Cameron Compression Systems used NVision HandHeld laser scanners to produce a solid model of an existing large engine in one-tenth of the time that would have been required using conventional methods.

Product News: Nikon Upgrades Software for iNEXIV Multisensor Measuring System

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(Nikon Instruments Inc.: Melville, NY) -- Nikon Instruments Inc. recently announced the availability of the iNEXIV VMA Automeasure Version 2.5 software specifically designed for the iNEXIV VMA-2520 multisensor measuring system.

Product News: QC Microscope Offers 3-D Nanotopography Analysis

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(MicroDynamics: Woodstock, GA) -- MicroDynamics announces the release of the new MD-MicroQC, a lightweight, durable surface inspection microscope.

Product News: DMIS Output Tools by CMM Technology Solutions

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(Dimensional Metrology Standards Consortium: Arlington, TX) -- The new DMIS Output Tools are inexpensive and easy-to-use reporting tools. The DMIS Output Tools application offers a simple set of data reporting and export capabilities based on standard DMIS output files.

Event: RAPID 2010 Conference and Exposition

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(Society of Manufacturing Engineers: Dearborn, MI) -- Be sure to mark May 18–20, 2010, on your calendar. That's the date for RAPID, North America's largest annual rapid and additive manufacturing conference and exposition. The event will be held at the Disneyland Hotel in Anaheim, California.

International Test Conference Approaching

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(ITC: New York) -- Register for the International Test Conference and make your online hotel reservations. Test Week events will be held Nov. 1-6, 2009, at the Austin Convention Center in Austin, Texas.

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