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Nikon Integrates Industrial Metrology and Semiconductor Inspection

Quality Digest
Mon, 04/11/2005 - 22:00
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Nikon Instruments Inc. recently announced the integration of its semiconductor inspection and Nexiv vision measuring systems under the company’s SITECH division, which is based in Tempe, Arizona.The purpose of the move is twofold. First, Nikon hopes to improve customer responsiveness by building on the synergies of the two teams and coordinating their applications engineering and service departments and product management and sales team. Second, it’s hoped the move will improve efficiency to prepare Nikon for future business opportunities. The new SITECH division will be divided into two departments: vision systems and semiconductor inspection. It will be led by general manager Takeshi Kamiya.

“This important change will enable these two businesses to share the facilities at our Tempe office, and—by combining our resources, personnel and facilities—position Nikon for broader growth within the semiconductor and vision systems measuring vertical business,” says Lee Shuett, Nikon executive vice president.

For more information, visit www.nikonusa.com.



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