(Zemetrics: Tucson, AZ) -- Zemetrics, maker of innovation-driven surface metrology products, introduces ZeScope, a subnanometer precision 3-D optical profilometer for general and industrial applications. The newly developed metrology system is distinctive in offering high-resolution imaging along with numerous motorized and automated ease-of-use features in a high-value standard product.

The mid-range priced ZeScope measures surfaces with vertical scanning interference microscopy, capable of measuring microsurface map height variations to within 0.01 nm repeatability—comparable to high-end optical profilometers. ZeScope’s measurements capture up to 1.3 million points of surface detail—the highest spatial sampling rate of any standard optical profilometer. ZeScope measures surfaces in 3-D, making it useful for assessing structural characteristics and ideal for volumetric metrology. Three-dimensional surface measurements are essential for such applications as wear of materials, ablation, tribology, and surface texture evaluation.

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