All News
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology Inc. has announced the immediate availability of the Endeavor 3 coordinate measuring machine (CMM), the next generation of their Endeavor CMM product line. This popular line of vertical CMMs introduces new sizes, additional models,…
(Sensor Products Inc.: Madison, NJ) -- To support academic research and development (R&D) efforts, Sensor Products Inc. is offering a 10-percent discount through Nov. 30 on Pressurex, a pressure-indicating sensor film for evaluating surface contact pressure distribution and magnitude. The 10-…
(Mahr Federal: Providence, RI) -- Mahr Federal Inc. has introduced a new option package for its well-known MarForm MMQ 200 Formtester, which provides the measurement of surface finish parameters according to accepted standards from the International Organization for Standardization (ISO) and the…
(AIA: Ann Arbor, MI) -- A new machine-vision market report shows that sales of machine vision components and systems in North America have entered a recovery phase. Overall machine vision sales increased by 34.4 percent during the first quarter of 2010 over weak sales that occurred during the…
(Global Industry Analysts Inc.: San Jose, CA) -- A newly released market research report by Global Industry Analysts Inc. on calibration services concludes that calibration of electrical and communications equipment, particularly in North America and Europe, will occupy a major share of the…
(Thwing-Albert Instrument Co: Chicago) -- Thwing-Albert announces the introduction of the newly designed, user-friendly, FP-2255 Coefficient of Friction (COF)/Peel Tester. The peel tester mode can be set up to perform 180° tests, 90° tests, and T-Peel tests for film-to-film, film-to-paper, and…
(Fluke Corp.: Sydney) -- Fluke Corp., a global provider of electronic test and measurement technology, has introduced the new 1594A/1595A Super-Thermometers from Hart Scientific, designed to combine accuracy, value, and innovative features for calibration of standard platinum resistance…
(Vaisala: St. Louis, MO) -- Quality managers in pharmaceutical, biotech, and other life science companies who are seeking ways to cope with humidity measurement problems and maintain full regulatory compliance are invited to attend a five-part no-cost webinar series, Humidity 101. It’s hosted by…
(Carl Zeiss MicroImaging: Thornwood, NY) -- Carl Zeiss MicroImaging Inc. introduces the new Axio Lab.A1 microscope. The Axio Lab.A1 is now available for use in polarization microscopy and is particularly suitable for requirements in student education and routine laboratories.
This upright…
(Carl Zeiss IMT: Maple Grove, MN) -- Carl Zeiss IMT and Koepfer America have formally joined with a new business partner agreement for the United States and Canada. This agreement will provide improved technical and marketing support related to all areas of coordinate measuring machine (CMM) gear…
(Nikon Metrology: Brighton, MI) -- Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform. Supported Nikon Metrology devices include the Laser Radar, K-Series…
(Nikon Metrology: Brighton, MI) -- Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform. Supported Nikon Metrology devices include the Laser Radar, K-Series…
(Delcam: Birmingham, UK) -- Delcam has launched the 2010 R2 version of its PowerINSPECT inspection software. The new release incorporates automatic surface inspection and the ability to use geometric dimensioning and tolerancing (GD&T) data from CATIA models, plus improvements to the handling…
(Mettler-Toledo Inc.: Columbus, OH) -- Mettler-Toledo introduces the new SWD440 dual-ended-beam weigh module. The SWD440 weigh modules offer good value for general-purpose weighing of tanks, hoppers, and original equipment manufacturer machinery. They use dual-ended-beam load cells to deliver…
Fluorescence microscopy requires an intense light source at the specific wavelength that will excite fluorescent dyes and proteins. The traditional method employs a white light, typically from a mercury or xenon arc lamp. Although such broad spectrum lamps can generate ample light at desired…
(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc. will distribute Lasertec’s Optelics H1200, a real color confocal microscope with unprecedented color separation and high resolution. The two companies have agreed that Nikon will distribute the system in the United States and Canada.
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(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc. introduces the Confocal NEXIV-K6555 with advanced confocal metrology capabilities that provide new measurement possibilities for demanding applications. The Confocal NEXIV-K6555 incorporates the latest Confocal, image processing, and Through…
(Carl Zeiss: Oberkochen, Germany) -- Carl Zeiss now offers the fifth generation of contact scanning with the new VAST Performance Kit. The kit is optionally available for the top-of-the-line PRISMO, CenterMax, and GageMax coordinate measuring machines and incorporates various elements of optimized…
(Nikon Metrology: Brighton, MI) -- Nikon Metrology Inc. introduces the Eclipse L300N/L300ND, an FPD/LSI inspection microscope with an enhanced epi-fluorescence function enabling 365 nm UV excitation, optimal for inspecting semiconductor resist residues on 300 mm wafers and organic…
(FARO: Lake Mary, FL) -- FARO Technologies Inc., global provider of portable 3-D measurement and imaging solutions, has released an accurate, break-resistant, spherically mounted retroreflector (SMR) as a part of its newly expanded line of laser tracker targets.
The break-resistant SMRs offer…
(Olympus NDT: Waltham, MA) -- Olympus NDT introduces the first semiautomated (semi-AUT) ultrasound phased-array solution developed for corrosion mapping applications. This portable inspection solution comprises several components, including the OmniScan MX PA flaw detector, OmniScan MXU software…
(Veeco: Tucson) -- Veeco Instruments Inc., a global provider of precision instrumentation and metrology solutions, announces a new ContourGT Optical Surface Profiler configuration optimized for characterizing high-brightness, light-emitting diode (HB-LED) patterned sapphire substrates (PSS). The…
(Carl Zeiss: Oberkochen, Germany) -- Systematically implementing customer requests was the main challenge in developing the new ACCURA coordinate measuring machine. The result is a multisensor-capable measuring system that permits fast, economical, precise, and flexible measurements—primarily due…
(Exact Metrology Inc.: Cincinnati) -- Exact Metrology Inc. has opened a new office in the Milwaukee suburb of Brookfield, Wisconsin. The facility will support the company’s rapidly growing contract measurement services business, as well as provide technical support and training to Exact Metrology…
(Fluke Corp.: Everett, WA) -- Electronic test-and-measurement technology provider Fluke Corp. has introduced the 1594A/1595A Super-Thermometers from Hart Scientific, designed to combine accuracy, value, and innovative features for calibrating SPRTs, PRTs, and thermistors.
The Fluke 1594A…
