Mon, 11/30/2009 - 12:35
(Solar Metrology: Halbrook, NY) -- Solar Metrology expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH.
Solar Metrology’s…

Solar Metrology
Metrologist
Solar Metrology was created to address the metrology needs of the rapidly growing Solar PV electric industry. Our team of scientists, engineers, applications specialists, and support personnel is the most experienced in the XRF thin film measurement industry, with a track record of more than 20 years of technical innovation and dedicated customer service.
Mon, 11/30/2009 - 12:35