Fabian Peréz-Willard

Inventor and author

Fabián Pérez-Willard joined Carl Zeiss Microscopy in 2006 as an application specialist for Crossbeam and helium ion microscopes, becoming part of their product management team group in 2011. Born in Spain, he completed his PhD in low-temperature Physics at the University of Karlsruhe in Germany in 2003, where he then stayed on as the head of a multiuser interdisciplinary lab facility with a focus on the preparation of functional nanostructures by lithography and their characterization by electron microscopy before taking his talents and experience to Zeiss.

Wed, 10/02/2013 - 12:20
Using Atomic Force Microscopy With a Scanning Electron MicroscopeZeiss’ AFM option for its MERLIN series helps characterize nanostructures
Wed, 10/02/2013 - 12:20
The AFM Option for the ZEISS MERLIN series combines a high-end, atomic force microscope (AFM) with a scanning electron microscope (SEM) to produce in situ, high-resolution AFM measurements in the SEM. The combination opens up new possibilities for…