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Charles Tarrio

Charles Tarrio received his BS from Bates College in Lewiston, Maine, and Ph.D. in physics from the University of Virginia. He has been at NIST since 1991 developing at-wavelength EUV metrology and studying properties and contamination of EUV optics.

Tue, 05/19/2020 - 12:02
How Extreme Ultraviolet Light Helps Give Us Smarter Smartphones and Stronger SatellitesTurning synchrotron radiation into a useful tool
Tue, 05/19/2020 - 12:02
In 2019, after decades of effort, manufacturers used a new technology to create smartphones with individual circuit features as small as 7 nanometers (nm), or billionths of a meter, enabling them to cram 8.5 billion electronic devices, known as…
      

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