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Sunnen Acquires Hommel Präzision
Former service partner provides honing and deep-hole drilling solutions
Brunson Rolls Out Rock Steady Line of Mobile Metrology Stands
Redesigned family of heavy-duty shop stands delivers unprecedented metrology instrument mobility
New Quik-Cal LVDT Signal Conditioner Provides Reliability and Ease of Use
Diagnoses LVDT failures, disconnects, or short circuits
New Marposs Solution for Inspecting Welds on Pouch Cell Batteries
Using noncontact, interferometric technology
Starrett Automated Metrology and Force Measurement Inspection Solutions to Be Featured at ATX West
February 7–9, 2023, Booth 4171, Anaheim Convention Center
Opto Diode Introduces Large Electron Detector
New product for radiation detection applications

White Light Module With 500 mW Outperforms LED Light Sources
For endoscopes, microscopes, and systems where bright light is required in a confined space
Hexagon Invests $100 Million in Divergent Technologies Inc.
A pioneer of green manufacturing technologies with the first modular digital automotive factory
Teledyne FLIR Adds Six New Cameras
Blackfly S GigE line grows
Exact Metrology Trains the Next Generation of Workers
Biggest challenge is not finding people to work, but those with enough knowledge to operate the equipment
Peak Metrology Partners With IDC MicroInspection
Enabling core technologies for digital microscopes
Live, In-Person Surface Roughness, Texture, and Tribology Class/Workshop
May 3–5, 2023, in Livonia, Michigan
Videoscope Makes Wind Turbine Gearbox Inspections Faster, More Efficient
Compact IPLEX G Lite-W videoscope packs powerful features into a small body
How Do You Know You’re Getting What You Pay For at the Grocery Store?
Measuring grocery quality at the store
Starrett Introduces Enhanced, Highly Accurate Electronic Indicators
High accuracy to +/– 0.00005 in. and IP67 protection from hostile shop environments
Advanced Photonix Offers Surface-Mount Silicon and Indium Gallium Arsenide Photodetectors
Specially designed for automated SMT/SMD assembly and solder reflow mounts
NIST Technique Simultaneously Locates Multiple Defects on Microchip Circuits
Entering a new phase of flaw detection
VXintegrity Software Platform: Surface Damage Assessment Modernized
Complete NDT solution measures thickness loss on corroded, industrial, complex geometry
Digital Metrology Introduces TraceBoss Software for Portable Roughness Gauges
New software both accessible and affordable
New Accreditation Added for XRF Service Provider
Eastern Applied Research now has ISO 17034 certification in addition to ISO/IEC 17025

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