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The Great Double Stuf Controversy

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Nanosensors Could Aid Drug Manufacturing

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MIT chemical engineers have discovered that arrays of billions of nanoscale sensors have unique properties that could help pharmaceutical companies produce drugs—especially those based on antibodies—more safely and efficiently.

Faster Than a Speeding Bullet

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Decades of Top-Shelf Technical Presentations in Portable Metrology

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For the Coordinate Metrology Society, CMSC 2013 will be recognized as a landmark year in its quest to provide state-of-the-art information and best practices to the metrology industry.

Usability Engineering: When the Surface Becomes the Touchscreen

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This article is about how augmented reality (AR) techniques can change the way we use measurement equipment.

CMSC 2013 Shines in Sunny San Diego

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Location, location, location! Last month, a diverse assortment of metrologists, scientists, engineers, quality control specialists, manufacturers, educators, and students streamed into the 2013 Coordinate Metrology Systems Conference (CMSC).

Data Management

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NIST’s Indenter Tunes In to Measure Surface Properties

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Bright Future Beckons for Metrology Researcher

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A bright future beckons for a University of Huddersfield metrology instrumentation designer who has recently completed his doctorate, won a national award, and will now embark on a project to bring a patented product to the market.

Scanning the Brazilian National Football Team

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Pagination

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