Milliken’s ‘Meet the Makers’ Highlights Employee Contributions
(Milliken & Co.: Spartanburg, SC) -- Milliken & Co., a global leader in diversified manufacturing, has launched its
A New Method Makes High-Resolution Imaging More Accessible
(MIT: Cambridge, MA) -- A classic way to image nanoscale structures in cells is with expensive high-powered, super-resolution microscopes.
Wind Blade Composite Project From ORNL Wins Green Design Innovation Award
(ORNL: Oak Ridge, TN) -- Researchers from the U.S.
GFT Puts Manufacturing Data to Work
(GFT: New York) -- Manufacturers are in the midst of one of the most significant transformations of their time, defined in large part by new AI-powered efficiencies.
Scatter Correction CT Addresses X-ray Scatter in Industrial Scanning
(Nikon Metrology NV: Brighton, MI)—Nikon Metrology NV, a subsidiary of Nikon Corp., announces the launch of
Digital Twin Consortium Unveils Updated Definitions
(Digital Twin Consortium: Boston) -- Digital Twin Consortium (DTC) has announced revised definitions for
Faraday Enhances 3D-IC Design Service With Ansys Multiphysics Analysis
(Ansys: Canonsburg, PA) -- Faraday Technology Corp., a leading company in the semiconductor industry, is expanding its use of