AMT President Urges Congress to Assist Small Manufacturers
(AMT: McLean, VA) -- Testifying before the House Small Business Committee, Douglas K.
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Product News: SigmaXL Releases Version 6
(SigmaXL: Toronto) -- The provider of user-friendly Excel add-ins for statistical and graphical analysis, announces the release of SigmaXL Version 6.
New features include:
Using Ultrasound to Locate Low Level Leaks in Heat Exchangers
Ultrasonic leak detection has been used for a variety of applications ranging from energy reduction by locating compressed air leaks to quality assurance inspections, such as locating wind noise and water leaks in automobiles.
Automated Inspection and Gauging Improves Quality and Reduces Cost
Automated inspection and gauging systems can help companies to improve overall product quality and grow their business while reducing manufacturing costs, helping them to become more competitive in this difficult business climate.
CMSC: More Than a Trade Show for 3-D Measurement
The Coordinate Metrology Systems Conference (CMSC) is next week, July 20–24. There is no event in the United States better situated to communicate the value and return on investment of large scale 3-D metrology than the CMSC. This year’s CMSC, its 25th, will be held in Louisville, Kentucky.
Product News: Olympus Defect Review Solution
(Olympus: Center Valley, Pa.) -- Process engineers, fab managers, professionals in yield enhancement, process development, and failure analysis will benefit from the newly introduced Olympus defect inspection and review system, the company’s fast and accurate semiconductor defect review solution
Large-Scale 3-D Metrology Highlighted at Upcoming CMSC
Investing in capital equipment always involves an analysis of the return on investment (ROI), but never as much as during a recession.
Photogrammetry and 3-D Assembly
Three-dimensional (3-D) assembly refers to the use of high-accuracy, in-place, 3-D coordinate measurement devices for the digital assembly of parts. This process is often referred to as computer-aided manufacturing (CAM) or gaugeless manufacturing.
Statistical Technique Improves Precision of Nanotechnology Data
(Georgia Institute of Technology: Atlanta) -- A new statistical analysis technique that identifies and removes systematic bias, noise, and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have futur
County Questions the Real Value of Six Sigma
A lean Six Sigma program instituted by Erie County, New York, has come under fire recently.