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Organizations worldwide stand to lose an estimated $9 billion in 2018 to employees clicking on phishing emails. We hear about new phishing attacks regularly from the news and from our friends. So why do so many people still click? NIST research has uncovered one reason, and the findings could help CIOs mount a better defense.

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Story update 7/13/2018: This story was updated with a link to the released version of standard E3125–17.

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Augmenting its efforts to protect the nation’s critical assets from cybersecurity threats as well as protect individuals’ privacy, the National Institute of Standards and Technology (NIST) has issued a draft update to its Risk Management Framework (RMF) to help organizations more easily meet these goals.

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I n November 2018, in Versailles, France, representatives from 57 countries are expected to make history. They will vote to dramatically transform the international system that underpins global science and trade. This single action will finally realize scientists’ 150-year dream of a measurement system based entirely on unchanging fundamental properties of nature.

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You can’t see well without lenses that can focus, whether those lenses are in your eye or the microscope you peer through. An innovative way to focus beams of neutrons might allow scientists to probe the interiors of opaque objects at a size range they were blind to previously, allowing them to explore the innards of objects from meteorites to cutting-edge manufactured materials without damaging them.

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A decade before an iceberg shattered the hull plates of the Titanic and half a century before a plague of brittle fractures started sinking Liberty ships during World War II, scientists in the United States and France had devised a novel, and strikingly simple, method for measuring the way metal reacts to impact.

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(NIST: Gaithersburg, MD) -- If your organization is striving to achieve breakthrough performance and results, the recipients of the Malcolm Baldrige National Quality Award will soon be sharing their role-model best practices at the 30th Anniversary Quest for Excellence conference.

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Researchers at the National Institute of Standards and Technology (NIST) have invented a new approach to testing multilayered, 3D computer chips that are now appearing in some of the latest consumer devices. The method may be the answer the semiconductor industry needs to quickly assess the reliability of this relatively new chip construction model, which stacks layers of flat circuitry atop one another like floors in a building to help make chips ever-faster and packed with features.