(NIST: Gaithersburg, Maryland) -- The lack of common measurement methods among light-emitting diode (LED) and lighting manufacturers has affected the commercialization of solid-state lighting products. In a recent paper, “New Practical Method for Measurement of High-Power LEDs,” Proc.
(NIST: Gaithersburg, Maryland) -- Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of stress or strain in regions of a semiconductor device as small as 10 nanometers across.
Poor quality products, an unsafe work environment, or failure to comply with regulations ranging from product safety to social responsibility, can cause business disruption, financial loss, costly lawsuits, and long-lasting damage to the brand and corporate image of
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