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Geodetic Systems Inc. (GSI) to Host 2009 User Group Meeting

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(Geodetic Systems Inc.: Melbourne, Florida) -- GSI will host its 2009 user group  meeting from January 21–23, 2009 at the completely refurbished Crowne Plaza Oceanfront Resort and Spa Hotel in Melbourne, Florida.

Delcam’s PowerINSPECT Software Chosen for Nuclear Casting Inspection

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(Delcam International Inc.: Windsor, Ontario, Canada) -- Inspection with PowerINSPECT is helping J.P.

NRC Scientists Help Solve the Mysteries Behind the Mona Lisa

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A Happy Anniversary

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Greetings from your new Chairperson! It’s my pleasure to lead the Coordinate Metrology Society (CMS) into a new year.

Automated Protection for Portable Computer-Aided Metrology Tools

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In just the past two years, the functionality of portable computer-aided metrology system (CAMS) in harsh factory environments has improved a great deal.

CARAT-Duchatelet Employs Metris’ K-Scan MMD to Integrate Life Protection into Prestige VIP Vehicles

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As the world leader in armored prestige vehicles, CARAT-Duchatelet counts sheiks, kings, presidents, CEOs, and other wealthy VIPs among its customers.

Quest for Quality in the Global Market

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Do you know what’s really going on in your overseas partners’ and suppliers’ plants? Are you sure? Many companies are unable to answer with a confident yes. That’s bad news.

Bright Idea Illuminates LED Standards

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(NIST: Gaithersburg, Maryland) -- The lack of common measurement methods among light-emitting diode (LED) and lighting manufacturers has affected the commercialization of solid-state lighting products. In a recent paper, “New Practical Method for Measurement of High-Power LEDs,” Proc.

Measuring Stress in Nanoscale Strains

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(NIST: Gaithersburg, Maryland) -- Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of stress or strain in regions of a semiconductor device as small as 10 nanometers across.

SimNet 8 Universal Idea Management Software Brochure

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