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NQF Helps Ensure Health IT Captures Information to Drive Quality Improvement

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(NQF: Washington) -- The National Quality Forum (NQF) recently released the Quality Data Set (QDS), a common technological framework for defining clinical data necessary to measure performance and accelerate improvement in patients’ quality of care.

Event: WESTEC—Where Manufacturers Go When the Game Changes

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(SME: Dearborn, MI) -- The Society of Manufacturing Engineers (SME) provides another look into the latest technologies and production methods at WESTEC 2010 Exposition.

Lean Management in Hospitals--The Humboldt Way

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St. Joseph Health System-Humboldt County (SJHS-Humboldt County) is committed to meeting the highest standards in health care delivery. SJHS-Humboldt County consists of two hospitals: St.

The Four Questions of Data Analysis

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The four questions of data analysis are the questions of description, probability, inference, and homogeneity. Any data analyst needs to know how to organize and use these four questions to be able to obtain meaningful and correct results.

ISO Publishes New Standard for Effective Risk Management

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(ISO: Geneva) -- A new international standard, ISO 31000:2009—“Risk management—Principles and guidelines,” will help organizations of all types and sizes to manage risk effectively.

Database Provides Centralized Info for Medical Device Professionals

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(ANSI: New York) -- The American National Standards Institute (ANSI) has joined forces with three of the biggest names in standards to develop an unprecedented resource for medical device standards and related information.

Can Lean Co-Exist With Innovation?

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“Lean” has come to mean an integrated, end-to-end process viewpoint that combines the concepts of waste elimination, just-in-time inventory management, built-in quality, and worker involvement supported by a cultural focus on problem solving.

America’s Best Health Insurance Plans

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(NCQA: Washington) -- U.S.

Product News: Line-Mountable XRF Yield-Management Tool

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(Solar Metrology: Halbrook, NY) -- Solar Metrology expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-Remote static head ILH.

Product News: DuraScan Micro/Macro Hardness Testers

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(Struers Inc.: Westlake, OH) -- Struers Inc. introduces its new state-of-the-art micro/macro hardness testing product line, the DuraScan. With its extensive features and benefits, the DuraScan is a natural complement to Struers existing hardness testers.

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