(Spar Point Research LLC: Danvers, MA) -- Spar Point Research LLC invites presentation abstracts for the SPAR Europe 2010 conference, which will be combined with Plant-Tech 2010, Dec. 7–8, at the Amsterdam RAI Convention Center. Deadline for abstracts is Friday, July 2.
In a recent e-mail, a reader of my blog asked me, “How can we enhance top management commitment and involvement for implementing total productive maintenance (TPM)?”
Nearly 30 years ago, Autodesk led the charge to bring computer-aided design (CAD) to the masses, winning over millions of users.
(APICS: Chicago) -- The 2010 APICS International Conference & Expo, “Excellence in the New Normal,” sponsored by APICS (The Association for Operations Management), is the highest quality educational experience for professionals in supply chain and operations management.
(API: Rockville, MD) -- Northrop Grumman Corp. has successfully deployed the Volumetric Error Compensation (VEC) service from Automated Precision Inc.
(Fluke Corp.: Everett, WA) --Fluke Corp., a global provider of electronic test and measurement technology, has introduced the new Fluke 5080A calibrator, engineered
(Destination CRM: New York) -- Customer relationship management (CRM) is a companywide business strategy designed to reduce costs and increase profitability by solidifying customer satisfaction, loyalty, and advocacy.
(Carl Zeiss: Oberkochen, Germany) -- With the latest version of its standard measuring software CALYPSO, Carl Zeiss offers additional functions with outstanding properties for users of measuring technology.
(Devista: Amstelveen, The Netherlands) -- Devista released Teamwork Planner 2.0, its Gantt chart planning tool for Windows XP and Vista 7. Teamwork Planner targets project managers of teams of two to 12 people and replaces the spreadsheets that many project managers use to do their planning.
(Keithley Instruments Inc.: Cleveland) -- Many people need to make electrical measurements but are not necessarily experts in that field. Countless applications such as current, voltage, resistivity, and temperature often require measurements to a quality level that is not easily achievable.