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Product News: Veeco Introduces the NT9080 Surface Metrology System

Combines noncontact white light interferometry, ease of use, and affordability for expert- and entry-level precision surface measurements

Veeco Instruments Inc.
Tue, 01/26/2010 - 12:01
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(Veeco Instruments Inc.: Plainview, NY) -- Veeco Instruments Inc., a provider of scientific and industrial metrology, has introduced the NT9080 Surface Metrology System, which combines noncontact white light interferometry, operator ease of use, and affordability for expert- and entry-level precision surface measurements. Utilizing more than 25 years of Veeco’s optical profiler technology expertise, the NT9080 is a streamlined 3-D measurement system suited to a wide range of cost-sensitive research and industry applications, from solar cell texture mapping to the characterization of precision machined parts.

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“With the NT9080, Veeco has responded to a need in the precision machining, medical, printing, and solar markets for a value-optimized, noncontact 3-D microscope for dedicated surface texture measurements,” says Mark R. Munch, executive vice president of Veeco Metrology. “The NT9080 performs the critical measurements necessary to increase yield and reduce manufacturing costs, without the complex operation and higher-priced features often required for automated applications.”

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