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NIST Develops Novel Ion Trap for Sensing Force and Light

Holds promise as a stylus for sensing very small forces.

NIST
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Tue, 07/07/2009 - 13:22
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(NIST: Gaithersburg, MD) -- Miniature devices for trapping ions (electrically charged atoms) are common components in atomic clocks and quantum computing research. Now, a novel ion trap geometry demonstrated at the National Institute of Standards and Technology (NIST) could usher in a new generation of applications, because the device holds promise as a stylus for sensing very small forces or as an interface for efficient transfer of individual light particles for quantum communications.


NIST

The NIST "stylus trap" can hold a single ion above any of the three sets of concentric cylinders on the centerline. The device could be used as a stylus with a single atom "tip" for sensing very small forces or an interface for efficient transfer of individual light particles for quantum communications.
Credit: Maiwald, NIST
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