{domain:"www.qualitydigest.com",server:"169.47.211.87"} Skip to main content

        
User account menu
Main navigation
  • Topics
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Roadshow
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Videos/Webinars
    • All videos
    • Product Demos
    • Webinars
  • Advertise
    • Advertise
    • Submit B2B Press Release
    • Write for us
  • Metrology Hub
  • Training
  • Subscribe
  • Log in
Mobile Menu
  • Home
  • Topics
    • 3D Metrology-CMSC
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Roadshow
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Login / Subscribe
  • More...
    • All Features
    • All News
    • All Videos
    • Training

Nikon Enhances X-Ray and CT Systems

Scans heavier samples, provides electrostatic and radiation protection

Quality Digest
Bio
Thu, 12/18/2025 - 12:02
  • Comment
  • RSS

Social Sharing block

  • Print
Body

(Nikon: Brighton, MI) -- Nikon Corp. announces a comprehensive suite of enhancements to its XT V Series X-ray and CT systems, strengthening the platform’s position as a world-class solution for nondestructive inspection of electronic components. These enhancements enable operators to achieve better image quality, scan heavier samples, and protect sensitive components from electrostatic discharge and radiation damage.

ADVERTISEMENT

A software enhancement and five hardware enhancements are available as optional upgrades to the XT V Series, allowing customers to customize systems based on their specific application requirements.

Software enhancement

High contrast filter 2.0: Offers consistently clear imaging that ensures defects are visible immediately for any combination of sample shape and density.

Hardware enhancements

Heavy-duty tray: Enables larger, heavier parts to be scanned. Operators can scan more parts in each batch and expand inspection capabilities.

Diamond window: Delivers improved image contrast across the operating range, particularly for low-density and mixed-material samples, resulting in less noise and faster scans.

Low-dose collimator: Protects radiation-sensitive electronics, minimizing dose to sensitive parts such as semiconductor devices while enabling safe inspection of larger batches.

ESD safety upgrade: Provides ESD-safe inspection of sensitive electronic components to IEC 6100-4-2, ANSI/ESD S20.20, and JEDEC JESD625 standards when installed in an ESD-protected area (EPA), enabling integration into ESD-safe processes.

High-magnification CT arm: Enables higher-magnification CT scans for small samples, enabling operators to see finer details than previously possible.

The XT V Series continues to excel in electronics inspection applications, including PCBs, BGAs, chips, and semiconductor devices. The systems maintain their market-leading Xi microfocus X-ray sources and powerful image-enhancement capabilities, while the new enhancements provide additional value for customers in electronics manufacturing, semiconductor production, and quality control environments.

More information about the enhanced XT V Series is available on Nikon’s website.

Add new comment

The content of this field is kept private and will not be shown publicly.
About text formats
Image CAPTCHA
Enter the characters shown in the image.

© 2025 Quality Digest. Copyright on content held by Quality Digest or by individual authors. Contact Quality Digest for reprint information.
“Quality Digest" is a trademark owned by Quality Circle Institute Inc.

footer
  • Home
  • Print QD: 1995-2008
  • Print QD: 2008-2009
  • Videos
  • Privacy Policy
  • Write for us
footer second menu
  • Subscribe to Quality Digest
  • About Us