(SICK: Minneapolis) -- SICK announces the launch of the OD200, a miniature measuring distance sensor for short ranges that will set new standards in its class thanks to its outstanding measurement stability on highly reflective, black, and irregular surfaces.
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With a newly developed measuring core, high-resolution receiver line, and an optimized optical system, the displacement sensor will raise the bar with respect to measured value stability and reliable, reproducible detection and switching behavior. The result is high productivity, even in complex, demanding applications.
The distance sensor can be put into operation easily and conveniently, plug and play. It offers all the standard connectivity options and enables high process speed with full measurement performance. In addition to the measured values, the sensor also provides data for in-line optimization of the measurement performance and for ongoing condition monitoring. This makes the OD200 ideal for various industries, including the automotive, consumer goods, electronics, and mechanical and plant engineering.
The OD200 expands SICK’s portfolio of displacement sensors and complements the range of applications of the OD Mini. Moreover, the new distance sensor will be a significant upgrade on the previous market standard.
Delivers measurements on highly reflective, black, and irregular surfaces
In industrial production, assembly, and quality processes, certain surfaces can pose challenges for precise measurements—for example, reflective, irregular, or complexly structured material surfaces such as carbon fiber composites, die castings, or finely textured metals. They can lead to inaccurate or missing measured values—especially in difficult lighting conditions or when components are small. OD200 achieves more accurate measurements on these challenging surfaces.
Robust measurement results for all materials and environmental conditions
The OD200 delivers more stable and accurate measurement results on complex surfaces. The newly developed triangulation measurement core with its powerful evaluation algorithms plays a key role in delivering this high level of accuracy. It’s currently designed for process speeds up to 3 kHz and is available in various sensor variants for measuring ranges of 25 mm–160 mm.
In addition, the high-resolution receiver unit ensures that even surfaces with low remission are reliably detected. Finally, the optical system was further optimized regarding the geometry and homogeneity of the light spot as well as ambient light immunity. When combined, these features ensure reliable measuring and switching behavior for high-gloss, reflective, or virtually remission-free objects, as well as for structured and inhomogeneous surfaces or in critical ambient brightness. Interference caused by incorrect measurements and missing signals is therefore significantly reduced compared to standard devices on the market. All of this translates to less downtime, less adjustment, less maintenance effort, and higher productivity.
Integration, commissioning, connectivity: All plug and play
Integration and commissioning of the OD200 is simple and compatible with all industry standards. Thanks to its miniature housing, the sensor has sufficient installation space, even in confined spaces. Intelligent default settings and algorithms as well as the intuitive, menu-driven user interface on the device’s display, if required, simplify the setup and operation of the sensor. With no need for further parameterization, plug and play saves time and effort. The connectivity options of the OD200 include all required and industry-standard interfaces and I/Os, including IO-Link, an analog current/voltage output, as well as one switching input and output. The OD200 offers flexibility when integrated into automation systems and Industry 4.0 environments. IO-Link ensures full access to the sensor, even in difficult or inaccessible installation locations.
In-line optimization and condition monitoring
In addition to the actual measurement data, the OD200 provides various operating data, for example, on the exposure time or the width of the signal peak, which is evaluated to calculate the distance. This information can be used both for optimizing in-line sensor performance and monitoring the sensor or processes.
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