(ZEISS: Oberkochen, Germany) -- ZEISS now offers its highly flexible and efficient software suite ZEN core for all ZEISS scanning electron microscopes (SEMs), including focused ion-beam scanning electron microscopes (FIB-SEMs).

ZEN stands for ZEISS Efficient Navigation and lets microscopists obtain more meaningful information. Users in a variety of fields—including materials research, natural resources, electronics, and life sciences—in both industry and academia can perform exactly the microscopy workflows they need in their laboratories. This innovative software streamlines image acquisition, analysis, and data management.

ZEISS ZEN core now includes basic control of SEMs and FIB-SEMs. Both nonexperts and experienced professionals benefit from the integration of SEM imaging and EDS analytics, as well as enhancements in AI-based workflows. FIB-SEM users can maximize throughput reliably by using the fully automated TEM lamella preparation.

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