(Nikon: Tokyo) -- Nikon Corp. has launched Limited Angle CT, an innovative computed tomography (CT) scanning technology for its range of VOXLS and XT H 225 industrial X-ray inspection systems. This technology advances CT scanning by delivering high-resolution imaging without the need for a full 360° sample rotation. By allowing samples to be positioned closer to the X-ray source, Limited Angle CT achieves higher magnification, providing detailed inspection of specific areas of interest within larger components.

Designed to meet the demands of high-end industry, this advancement is particularly well-suited for inspecting planar or geometrically complex components such as printed circuit boards, pouch and prismatic EV battery cells, and carbon fiber parts. Its unique capabilities empower manufacturers to streamline their inspection processes while maintaining precision and efficiency.

Key features

• Superior resolution—Achieves smaller voxel resolution for samples with high aspect ratios or complex geometries, where traditional geometric magnification would be limited.
• Optimized reconstruction—Nikon’s proprietary algorithm delivers datasets without quality or accuracy loss, despite reduced rotation angles, matching conventional CT performance.
• Automated operation—Nikon’s center of rotation calculation enables fully automated scans without manual intervention or positioning aids.
• Rapid acquisition—Completes detailed scans in minutes, significantly faster than traditional X-ray microscopy methods for comparable applications.

“Limited Angle CT represents an expansion of the inspection capabilities of our X-ray CT systems,” says Nikon’s X-ray product manager, Ben Morgan. “It is one of several advanced imaging techniques available within Nikon’s CT toolbox. Limited Angle CT complements other methods such as X.Tend (Helical CT), Panel Shift CT, Tilted CT, and Scatter Correction CT. This versatility within a system allows operators to select the most suitable technique for each specific inspection task. With Limited Angle CT, high-magnification inspection of specific regions within larger samples is now possible.”