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High-Resolution, Extended SWIR Camera for Beam Profiling

Supports extended SWIR wavelength response for beam profiling from the visible to 2050 nm using single imager

Wed, 02/09/2022 - 11:57
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(Princeton Infrared Technologies: Monmouth Junction, NJ) -- Princeton Infrared Technologies (PIRT), specialists in indium gallium arsenide (InGaAs) imaging technology and affordable shortwave-infrared (SWIR) linescan cameras, visible-SWIR science cameras, and 1- and 2D imaging arrays, has introduced the 1280BPCam, an extended-SWIR response camera developed specifically for laser beam profiling.

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The new InGaAs/GaAsSb (InGaAs/gallium arsenide antimonide) type-II super lattice (T2SL) detector features 1280 x 1024 pixels on a small 12-µm array pitch that delivers 90 frames per second (fps) at full resolution. The extended wavelength response of the T2SL material, plus the three-stage thermoelectric cooler (TEC), enable high sensitivity from 400 nm to 2050 nm, making it possible to image from the visible out to the SWIR spectrum with a single imager. The high-resolution imagers are specially fabricated on 100 mm substrates to enable low-cost production.

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