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Quantum Dot Technique Combines Optical and Electron Microscopy

Evades two problems in nanoscale microscopy

NIST
Wed, 06/26/2013 - 08:54
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Researchers working at the National Institute of Standards and Technology (NIST) have developed a new microscopy technique that uses a process similar to how an old tube television produces a picture—called cathodoluminescence—to image nanoscale features. Combining the best features of optical and scanning electron microscopy, the fast, versatile, and high-resolution technique allows scientists to view surface and subsurface features potentially as small as 10 nanometers in size.

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The new microscopy technique, described in an article published in the journal AIP Advances, uses a beam of electrons to excite a specially engineered array of quantum dots, causing them to emit low-energy visible light very close to the surface of the sample, exploiting so-called “near-field” effects of light. By correlating the local effects of this emitted light with the position of the electron beam, spatial images of these effects can be reconstructed with nanometer-scale resolution.

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