{domain:"www.qualitydigest.com",server:"169.47.211.87"} Skip to main content

User account menu
Main navigation
  • Topics
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Videos/Webinars
    • All videos
    • Product Demos
    • Webinars
  • Advertise
    • Advertise
    • Submit B2B Press Release
    • Write for us
  • Metrology Hub
  • Training
  • Subscribe
  • Log in
Mobile Menu
  • Home
  • Topics
    • 3D Metrology-CMSC
    • Customer Care
    • FDA Compliance
    • Healthcare
    • Innovation
    • Lean
    • Management
    • Metrology
    • Operations
    • Risk Management
    • Six Sigma
    • Standards
    • Statistics
    • Supply Chain
    • Sustainability
    • Training
  • Login / Subscribe
  • More...
    • All Features
    • All News
    • All Videos
    • Contact
    • Training

Perform Profile and Roughness Measurements on Nearly Any Material

VK-X Series 3-D laser scanning microscope combines capabilities of a SEM with the ease of optical microscope

Keyence Corp.
Fri, 07/08/2011 - 10:16
  • Comment
  • RSS

Social Sharing block

  • Print
Body

(Keyence: Woodcliff Lake, NJ) --The Keyence VK-X Series 3-D laser scanning microscopes combine the capabilities of SEMs and noncontact roughness gauges with the simplicity of an optical microscope. This newly released system now boasts an unprecedented 0.5 nanometer Z-axis resolution with a magnification range spanning 200x–24,000x. The usability and ease-of-use have been further improved with the addition of the AI-Scan function, allowing users to image and measure a target with just a click of the mouse.

ADVERTISEMENT

With high-resolution color imaging and nanometer-level profile measurement functions, the VK-X Series laser scanning microscopes have been designed to overcome the inadequacies of conventional imaging and profiling technologies. A short-wavelength laser scans across a target to provide noncontact profile, roughness, and thickness measurements—even on targets with highly angular surfaces. By combining the laser with an industry-leading, 16-bit photomultiplier, the VK-X can obtain an image and measurement on nearly any type of material, as well as thickness measurements on transparent films and coatings.

 …

Want to continue?
Log in or create a FREE account.
Enter your username or email address
Enter the password that accompanies your username.
By logging in you agree to receive communication from Quality Digest. Privacy Policy.
Create a FREE account
Forgot My Password

Add new comment

Image CAPTCHA
Enter the characters shown in the image.
Please login to comment.
      

© 2025 Quality Digest. Copyright on content held by Quality Digest or by individual authors. Contact Quality Digest for reprint information.
“Quality Digest" is a trademark owned by Quality Circle Institute Inc.

footer
  • Home
  • Print QD: 1995-2008
  • Print QD: 2008-2009
  • Videos
  • Privacy Policy
  • Write for us
footer second menu
  • Subscribe to Quality Digest
  • About Us
  • Contact Us